An investigation of chaos in the \(RL\)-diode circuit using the BDS test
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Publication:1281352
DOI10.1155/S117391269800011XzbMath1054.62630MaRDI QIDQ1281352
Publication date: 20 June 1999
Published in: Journal of Applied Mathematics and Decision Sciences (Search for Journal in Brave)
Full work available at URL: https://eudml.org/doc/124141
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