An analytical delay model

DOI10.1007/BF02946516zbMath0961.94018MaRDI QIDQ1288428

Zhongcheng Li, Yinghua Min

Publication date: 11 May 1999

Published in: Journal of Computer Science and Technology (Search for Journal in Brave)

zbMATH Keywords

delay modelBoolean processwaveformshigh performance digital circuitspath sensitization

Mathematics Subject Classification ID

Fault detection; testing in circuits and networks (94C12) Analytic circuit theory (94C05)

Cites Work

• Boolean process
• Test generation for path delay faults using binary decision diagrams
• Unnamed Item

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