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Thick points for transient symmetric stable processes

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Publication:1293640
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DOI10.1214/EJP.v4-47zbMath0927.60077OpenAlexW2090935110MaRDI QIDQ1293640

Amir Dembo, Yuval Peres, Ofer Zeitouni, Jay S. Rosen

Publication date: 8 July 1999

Published in: Electronic Journal of Probability (Search for Journal in Brave)

Full work available at URL: https://eudml.org/doc/120048

zbMATH Keywords

occupation measurestable processmultifractal spectrum


Mathematics Subject Classification ID

Local time and additive functionals (60J55)


Related Items

Thick points for spatial Brownian motion: multifractal analysis of occupation measure., Tightness for thick points in two dimensions, Hausdorff dimension of the contours of symmetric additive Lévy processes, Thick points of the Gaussian free field, The fractal structures of the exceptional sets of Lévy processes, Thick points for intersections of planar sample paths



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