Bayesian analysis for masked system failure data using non-identical Weibull models
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Publication:1300937
DOI10.1016/S0378-3758(98)00218-3zbMath1057.62532OpenAlexW1975676394MaRDI QIDQ1300937
Asit P. Basu, Chiranjit Mukhopadhyay, Sanjib Basu
Publication date: 1999
Published in: Journal of Statistical Planning and Inference (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1016/s0378-3758(98)00218-3
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