Type-I intermittency in semiconductor breakdown-experimental consequences of bifurcations from a toroidal attractor

DOI10.1016/0167-2789(93)90237-UzbMath0784.58063OpenAlexW2039236004WikidataQ64175889 ScholiaQ64175889MaRDI QIDQ1312414

V. Pereyra

Publication date: 9 February 1994

Published in: Physica D (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1016/0167-2789(93)90237-u

zbMATH Keywords

chaosbifurcationfluctuationssemiconductoroscillationsgermaniumtoroidal attractorionization breakdown

Mathematics Subject Classification ID

Applications of global analysis to the sciences (58Z05) Chemically reacting flows (80A32) General topics in optics and electromagnetic theory (78A99)

Cites Work

• An experimental observation of a new type of intermittency
• Onset of Intermittency from Torus

This page was built for publication: Type-I intermittency in semiconductor breakdown-experimental consequences of bifurcations from a toroidal attractor