Morphological stability of epitaxial thin elastic films by van der Waals force
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Publication:1349257
DOI10.1007/S004190100194zbMath1016.74042OpenAlexW2172050715MaRDI QIDQ1349257
Publication date: 21 May 2002
Published in: Archive of Applied Mechanics (Search for Journal in Brave)
Full work available at URL: http://dspace.imech.ac.cn/handle/311007/16779
perturbationlower boundvan der Waals forcesubstratemorphological stabilitycritical undulation wavelengthepitaxial thin elastic filmsnegative Hamaker constant
Related Items (4)
Interfacial slippage effect on the spontaneous instability of soft thin viscoelastic films ⋮ Spinodal surface instability of soft elastic thin films ⋮ Three-dimensional analysis of the spontaneous instability for soft thin viscoelastic films ⋮ Effects of elastic anisotropy on the surface stability of thin film/substrate system
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