A nonlinear stability analysis of pattern formation in thin liquid films.

DOI10.4171/IFB/69zbMath1038.35081OpenAlexW2056509282MaRDI QIDQ1396045

David J. Wollkind, Emily M. Tian

Publication date: 2003

Published in: Interfaces and Free Boundaries (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.4171/ifb/69

zbMATH Keywords

nonlinear stability analysisthin liquid filmshexagonal pattern formationmorphological phase separation

Mathematics Subject Classification ID

PDEs in connection with fluid mechanics (35Q35) Statistical mechanics of polymers (82D60) Lubrication theory (76D08) Free boundary problems for PDEs (35R35) Analysis of microstructure in solids (74N15)

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