Estimation of components reliability in a parallel system using masked system life data

DOI10.1016/S0096-3003(02)00099-1zbMath1019.62096MaRDI QIDQ1406115

Ammar M. Sarhan, Ahmed H. El-Bassiouny

Publication date: 9 September 2003

Published in: Applied Mathematics and Computation (Search for Journal in Brave)

zbMATH Keywords

maximum likelihood estimationBayes estimationmasked datasymmetrical triangle density function

Mathematics Subject Classification ID

Bayesian inference (62F15) Estimation in survival analysis and censored data (62N02) Reliability and life testing (62N05)

Related Items (6)

Robust Bayesian analysis for parallel system with masked data under inverse Weibull lifetime distribution ⋮ Analysis of masked data with Lindley failure model ⋮ STATISTICAL ANALYSIS OF SERIES SYSTEM FOR MASKED DATA UNDER SUCCESSIVE CENSORED LIFE TEST ⋮ Inference for a series system with dependent masked data under progressive interval censoring ⋮ Bayes estimators for reliability measures in geometric distribution model using masked system life test data ⋮ Parameter estimations in a general hazard rate model using masked data

Cites Work

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• Maximum likelihood analysis of component reliability using masked system life-test data
• Exact maximum likelihood estimation using masked system data

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