I\(_{\text{DDT}}\): Fundamentals and test generation

DOI10.1007/BF02948899zbMath1046.68029OpenAlexW1971333488MaRDI QIDQ1415925

QiJian Zhu, JiShun Kuang, Yinghua Min, Zhiqiang You

Publication date: 9 December 2003

Published in: Journal of Computer Science and Technology (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1007/bf02948899

zbMATH Keywords

\(I_{\text{DDT}}\) testingaverage transient currentlogical transition

Mathematics Subject Classification ID

Reliability, testing and fault tolerance of networks and computer systems (68M15)

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