Statistical pattern modeling in vision-based quality control systems

DOI10.1023/A:1025489610281zbMath1057.68100OpenAlexW1540893961WikidataQ58451246 ScholiaQ58451246MaRDI QIDQ1424757

Javier Otamendi, Arturo de la Escalera, Jose M. Armingol, Francisco J. Rodriguez, Jose Manuel Pastor

Publication date: 15 March 2004

Published in: Journal of Intelligent \& Robotic Systems (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1023/a:1025489610281

zbMATH Keywords

image processingstatistical pattern recognitionquality control chartsautomated visual inspectionsteel surfaces

Mathematics Subject Classification ID

Computing methodologies for image processing (68U10) Pattern recognition, speech recognition (68T10) Machine vision and scene understanding (68T45)

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