Parameter detection of thin films from their X-ray reflectivity by support vector machines.

DOI10.1016/j.apnum.2003.07.002zbMath1046.65118OpenAlexW2079810797MaRDI QIDQ1427212

Udo Welzel, Gabriele Drauschke, Daniel J. Strauss

Publication date: 14 March 2004

Published in: Applied Numerical Mathematics (Search for Journal in Brave)

Full work available at URL: https://ub-madoc.bib.uni-mannheim.de/1609/1/262_2001.pdf

zbMATH Keywords

algorithmquadratic programminginverse problemradial basis functionsthin filmsupport vector machinesoptical matrix methodreflectivity curvesrReproducing kernel Hilbert spacesX-ray reflectometry

Mathematics Subject Classification ID

Numerical mathematical programming methods (65K05) Quadratic programming (90C20) Parallel numerical computation (65Y05) Numerical methods for inverse problems for integral equations (65R32) Inverse problems for integral equations (45Q05)

Uses Software

• SVMTorch

Cites Work

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