A mixed-mode BIST scheme based on folding compression

DOI10.1007/BF02962213zbMath1004.68140OpenAlexW2017133511MaRDI QIDQ1613249

Hans-Joachim Wunderlich, Huaguo Liang, Sybille Hellebrand

Publication date: 28 August 2002

Published in: Journal of Computer Science and Technology (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1007/bf02962213

zbMATH Keywords

mixed mode scan-based BISTrandom pattern testing

Mathematics Subject Classification ID

Pattern recognition, speech recognition (68T10)

Cites Work

• A Greedy Heuristic for the Set-Covering Problem
• Built-in test for circuits with scan based on reseeding of multiple-polynomial linear feedback shift registers

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