A Bayesian semiparametric regression model for reliability data using effective age

DOI10.1016/J.CSDA.2013.11.015zbMath1506.62108OpenAlexW2052642427WikidataQ57963081 ScholiaQ57963081MaRDI QIDQ1623436

Timothy E. Hanson, Li Li

Publication date: 23 November 2018

Published in: Computational Statistics and Data Analysis (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1016/j.csda.2013.11.015

zbMATH Keywords

truncated datarepairable systemeffective agetailfree process

Mathematics Subject Classification ID

Computational methods for problems pertaining to statistics (62-08) Nonparametric regression and quantile regression (62G08) Nonparametric estimation (62G05) Bayesian inference (62F15) Reliability and life testing (62N05)

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Semi-parametric estimation of Brown-Proschan preventive maintenance effects and intrinsic wear-out

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