Topological derivative for imaging of thin electromagnetic inhomogeneity: least condition of incident directions
DOI10.1155/2018/2096058zbMath1406.35383OpenAlexW2794348810WikidataQ130204887 ScholiaQ130204887MaRDI QIDQ1629163
Publication date: 11 December 2018
Published in: Advances in Mathematical Physics (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1155/2018/2096058
PDEs in connection with optics and electromagnetic theory (35Q60) Numerical aspects of computer graphics, image analysis, and computational geometry (65D18) Bessel and Airy functions, cylinder functions, ({}_0F_1) (33C10) Inverse problems (including inverse scattering) in optics and electromagnetic theory (78A46)
Cites Work
- Topological derivative strategy for one-step iteration imaging of arbitrary shaped thin, curve-like electromagnetic inclusions
- Topological sensitivity analysis in the context of ultrasonic non-destructive testing
- Shape reconstruction of thin electromagnetic inclusions via boundary measurements: level-set method combined with the topological derivative
- Topological sensitivity analysis for the modified Helmholtz equation under an impedance condition on the boundary of a hole
- Multi-frequency topological derivative for approximate shape acquisition of curve-like thin electromagnetic inhomogeneities
- On the topological sensitivity of transient acoustic fields
- Crack reconstruction using a level-set strategy
- Incorporating topological derivatives into level set methods.
- The shape and topological optimizations' connection
- MUSIC algorithm for location searching of dielectric anomalies from \(S\)-parameters using microwave imaging
- Topological derivatives in shape optimization
- Fast identification of cracks using higher-order topological sensitivity for 2-D potential problems
- Incorporating topological derivatives into shape derivatives based level set methods
- Stability and Resolution Analysis for a Topological Derivative Based Imaging Functional
- A study on the topological derivative-based imaging of thin electromagnetic inhomogeneities in limited-aperture problems
- Asymptotic Imaging of Perfectly Conducting Cracks
- Topological Sensitivity for Solving Inverse Multiple Scattering Problems in Three-dimensional Electromagnetism. Part I: One Step Method
- Reconstruction of thin electromagnetic inclusions by a level-set method
- Solving inhomogeneous inverse problems by topological derivative methods
- Fast non-iterative methods for defect identification
- On the Topological Derivative in Shape Optimization
- Level set methods for inverse scattering
- A new method in inverse scattering based on the topological derivative
This page was built for publication: Topological derivative for imaging of thin electromagnetic inhomogeneity: least condition of incident directions
