Developing a sampling plan by variables inspection for controlling lot fraction of defectives

DOI10.1016/J.APM.2013.10.043zbMath1428.62523OpenAlexW2055832661MaRDI QIDQ1630162

Shih-Wen Liu, Chien-wei Wu

Publication date: 7 December 2018

Published in: Applied Mathematical Modelling (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1016/j.apm.2013.10.043

zbMATH Keywords

operating characteristic curveacceptable quality levelfraction of defectiveslot sentencingyield index

Mathematics Subject Classification ID

Applications of statistics in engineering and industry; control charts (62P30) Production models (90B30)

Related Items (16)

Optimal design of overall yield-based variable repetitive sampling plans for processes with multiple characteristics ⋮ A modified variables repetitive group sampling plan with the consideration of preceding lots information ⋮ Designing variables sampling plans based on the yield index S_pk ⋮ Developing variables sampling plans based on EWMA yield index ⋮ Optimal designing of multiple deferred (dependent) state repetitive group sampling plan for variables inspection ⋮ An optimal construction of yield-based EWMA repetitive multivariate sampling plan ⋮ An improved sampling plan by variables inspection with consideration of process yield and quality loss ⋮ Optimal truncated repetitive lot inspection with defect rates ⋮ Sampling schemes by variables inspection for the first-order autoregressive model between linear profiles ⋮ Efficient truncated repetitive lot inspection using Poisson defect counts and prior information ⋮ Explicit quasi-optimal inspection schemes from nonconformity count data with controlled producer and consumer risks ⋮ Controlling posterior producer and consumer risks in lot reinspection ⋮ Capability-based quick switching sampling system for lot disposition ⋮ Variable-sampling plans based on lifetime-performance index under exponential distribution with censoring and its extensions ⋮ Construction of closed interval for process capability indicesC_pu,C_pl, andS_pkbased on Boole’s inequality and de Morgan’s laws ⋮ Optimal lot disposition from Poisson-Lindley count data

Cites Work

• Unnamed Item
• Variables sampling inspection scheme for resubmitted lots based on the process capability index \(C_{pk}\)
• A variables sampling plan based on \(C_{\text{pmk}}\) for product acceptance determination
• Quality-yield measure for production processes with very low fraction defective
• Brocess capability with asymmetric tolerances

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