A multiscale coupled finite-element and phase-field framework to modeling stressed grain growth in polycrystalline thin films
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Publication:1674527
DOI10.1016/j.jcp.2016.09.061zbMath1375.74063OpenAlexW2529840982MaRDI QIDQ1674527
Publication date: 25 October 2017
Published in: Journal of Computational Physics (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1016/j.jcp.2016.09.061
finite element methodgrain growthnumerical simulationsphase-field methodconstitutive modelingpolycrystalline thin film
Finite element methods applied to problems in solid mechanics (74S05) Statistical mechanics of crystals (82D25) Thin films (74K35) Crystals in solids (74N05)
Uses Software
Cites Work
- Phase field modelling of stressed grain growth: analytical study and the effect of microstructural length scale
- A multiscale Taylor model-based constitutive theory describing grain growth in polycrystalline cubic metals
- Dynamic solid-solid transitions with phase characterized by an order parameter
- A phase field concept for multiphase systems
- On anisotropic order parameter models for multi-phase systems and their sharp interface limits
- A MATHEMATICAL MODEL FOR GRAIN GROWTH IN THIN METALLIC FILMS
- A MultiPhase Field Concept: Numerical Simulations of Moving Phase Boundaries and Multiple Junctions
- Stress- and diffusion-induced interface motion: Modelling and numerical simulations
- A generalized field method for multiphase transformations using interface fields