Effective dynamic properties of a row of elastic inclusions: the case of scalar shear waves
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Publication:1677100
DOI10.1007/s10659-017-9627-4zbMath1374.74106OpenAlexW2594868903MaRDI QIDQ1677100
Amine Sbitti, Kim Pham, Agnès Maurel, Jean-Jacques Marigo
Publication date: 10 November 2017
Published in: Journal of Elasticity (Search for Journal in Brave)
Full work available at URL: https://hal-polytechnique.archives-ouvertes.fr/hal-01657090/file/Marigo_etal.pdf
Bounds on effective properties in solid mechanics (74Q20) Effective constitutive equations in solid mechanics (74Q15) Homogenization and oscillations in dynamical problems of solid mechanics (74Q10)
Related Items (9)
Damping in a row of locally-resonant inclusions: dynamic homogenization and scattering of transient shear waves ⋮ Modelling resonant arrays of the Helmholtz type in the time domain ⋮ Time-domain simulation of wave propagation across resonant meta-interfaces ⋮ Asymptotic Characterization of Localized Defect Modes: Su–Schrieffer–Heeger and Related Models ⋮ Numerical homogenization by an adaptive Fourier spectral method on non-uniform grids using optimal transport ⋮ Effective resonant model and simulations in the time-domain of wave scattering from a periodic row of highly-contrasted inclusions ⋮ Perfect Brewster transmission through ultrathin perforated films ⋮ Analysis of boundary layer effects due to usual boundary conditions or geometrical defects in elastic plates under bending: an improvement of the Love-Kirchhoff model ⋮ Homogenization approach and Bloch-Floquet theory for band-gap prediction in 2D locally resonant metamaterials
Cites Work
- Approximate models for wave propagation across thin periodic interfaces
- Homogenized interface model describing inhomogeneities located on a surface
- Numerical modeling of the acoustic wave propagation across a homogenized rigid microstructure in the time domain
- Homogenization of Rough Boundaries and Interfaces
- High‐order asymptotics for the electromagnetic scattering by thin periodic layers
- Two-scale homogenization to determine effective parameters of thin metallic-structured films
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