A posteriori error control in numerical simulations of semiconductor nanodevices
DOI10.1016/j.cpc.2016.07.020zbMath1380.65343OpenAlexW2482421877MaRDI QIDQ1682685
Jinn-Liang Liu, Chun-Hsien Li, Ren-Chuen Chen
Publication date: 5 December 2017
Published in: Computer Physics Communications (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1016/j.cpc.2016.07.020
boundary layersenergy transportquantum effectadaptive finite elementinterior layersa posterior error estimatesemiconductors nanodevices
Error bounds for boundary value problems involving PDEs (65N15) Finite element, Rayleigh-Ritz and Galerkin methods for boundary value problems involving PDEs (65N30) PDEs in connection with quantum mechanics (35Q40) Statistical mechanics of nanostructures and nanoparticles (82D80)
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