Lehmann-type Laplace distribution-type I software reliability growth model

DOI10.1007/S12597-016-0281-6zbMath1378.62113OpenAlexW2514514311MaRDI QIDQ1684333

R. Poornima, V. S. Akilandeswari, V. Saavithri

Publication date: 8 December 2017

Published in: Opsearch (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1007/s12597-016-0281-6

zbMATH Keywords

WeibullBayesian information criterion (BIC)profile likelihoodAkaike information criterion (AIC)non-homogeneous Poisson process (NHPP)Goel-OkumotoKumaraswamy modified inverse Weibull (KMIW)Lehmann-type Laplace distribution type I (LLD-type I)Pareto type IIIstatistical process control (SPC)

Mathematics Subject Classification ID

Reliability, availability, maintenance, inspection in operations research (90B25) Reliability and life testing (62N05) Theory of software (68N99)

Cites Work

• A generalized logistic software reliability growth model
• Estimating the dimension of a model
• Time-Dependent Error-Detection Rate Model for Software Reliability and Other Performance Measures
• Predictability of software-reliability models

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