Investigation of plane defects in a dielectric wafer by spectral-domain integral equation method

DOI10.1007/S10598-016-9345-YzbMath1382.78007OpenAlexW2565850158MaRDI QIDQ1705387

V. V. Lopushenko

Publication date: 15 March 2018

Published in: Computational Mathematics and Modeling (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1007/s10598-016-9345-y

zbMATH Keywords

integral equationsdiffractionmathematical modelingnanostructureswave scattering

Mathematics Subject Classification ID

Diffraction, scattering (78A45) Spectral, collocation and related methods applied to problems in optics and electromagnetic theory (78M22)

Related Items (1)

Electric and magnetic dipole fields in the wave zone allowing for ground effects

Cites Work

• Analysis of plane cylindrical wafer defects by the spectral-domain integral equation method
• Method of integral equations in the spectral domain for the analysis of plane defects of a substrate
• Slot Coupling of Rectangular and Spherical Wave Guides

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