Test pattern generation effort evaluation of reversible circuits

DOI10.1007/978-3-319-59936-6_13zbMath1487.68106OpenAlexW2618032270MaRDI QIDQ1705602

Kamalika Datta, Robert Wille, Abhoy Kole, Indranil Sen Gupta

Publication date: 16 March 2018

Full work available at URL: https://doi.org/10.1007/978-3-319-59936-6_13

zbMATH Keywords

optimizationSATreversible circuitATPG

Mathematics Subject Classification ID

Fault detection; testing in circuits and networks (94C12) Problem solving in the context of artificial intelligence (heuristics, search strategies, etc.) (68T20) Networks and circuits as models of computation; circuit complexity (68Q06) Quantum gates (81P65)

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