Automatic test pattern generation for multiple missing gate faults in reversible circuits. Work in progress report

DOI10.1007/978-3-319-59936-6_14zbMath1487.68112OpenAlexW2620155333MaRDI QIDQ1705604

Robert Wille, Anupam Chattopadhyay, Anmol Prakash Surhonne

Publication date: 16 March 2018

Full work available at URL: https://doi.org/10.1007/978-3-319-59936-6_14

Quantum computation (81P68) Fault detection; testing in circuits and networks (94C12) Networks and circuits as models of computation; circuit complexity (68Q06) Quantum gates (81P65)

This page was built for publication: Automatic test pattern generation for multiple missing gate faults in reversible circuits. Work in progress report