Bayesian planning of optimal step-stress accelerated life test for log-location-scale distributions

DOI10.1007/S10255-018-0725-2OpenAlexW2790472089WikidataQ130150415 ScholiaQ130150415MaRDI QIDQ1709418

Yin-cai Tang, Qiang Guan

Publication date: 5 April 2018

Published in: Acta Mathematicae Applicatae Sinica. English Series (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1007/s10255-018-0725-2

zbMATH Keywords

accelerated life testingoptimal designGibbs samplingBayesian approachtype-I censoringlog-location-scale distributions

Mathematics Subject Classification ID

Reliability and life testing (62N05)

Related Items (1)

Statistical inference based on progressively type-II censored data from the Burr X distribution under progressive-stress accelerated life test

Uses Software

• SPLIDA

Cites Work

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• Optimum simple step-stress accelerated life tests with censoring
• Optimum Simple Step-Stress Plans for Accelerated Life Testing
• Accelerated Testing
• Theory for Optimum Censored Accelerated Life Tests for Normal and Lognormal Life Distributions
• Gibbs Sampling for Bayesian Non-Conjugate and Hierarchical Models by Using Auxiliary Variables
• Inference for a Simple Step-Stress Model with Type-I Censoring and Lognormally Distributed Lifetimes
• Reliability and Risk
• Optimum step‐stress accelerated life test plans for log‐location‐scale distributions

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