Entropy based test point evaluation and selection method for analog circuit fault diagnosis

DOI10.1155/2014/259430zbMath1407.94197OpenAlexW2023237504WikidataQ59065154 ScholiaQ59065154MaRDI QIDQ1717978

Yuan Gao, Chenglin Yang, Fang Chen, Shulin Tian

Publication date: 8 February 2019

Published in: Mathematical Problems in Engineering (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1155/2014/259430

Mathematics Subject Classification ID

Fault detection; testing in circuits and networks (94C12)

Cites Work

• Fast algorithms for selection of test nodes of an analog circuits using a generalized fault dictionary approach
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