Lower bounds for the lengths of single tests for Boolean circuits
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Publication:1741479
DOI10.1515/dma-2019-0004zbMath1454.94145OpenAlexW2916471771WikidataQ128315100 ScholiaQ128315100MaRDI QIDQ1741479
Publication date: 3 May 2019
Published in: Discrete Mathematics and Applications (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1515/dma-2019-0004
Related Items (4)
The length of single-fault detection tests with respect to substitution of inverters for combinational elements in some bases ⋮ A METHOD FOR CONSTRUCTING LOGIC NETWORKS ALLOWING SHORT SINGLE DIAGNOSTIC TESTS ⋮ Short single tests for circuits with arbitrary stuck-at faults at outputs of gates ⋮ The length of single fault detection tests with respect to substitution of gates with inverters
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- On the synthesis of circuits admitting complete fault detection test sets of constant length under arbitrary constant faults at the outputs of the gates
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- Easily Testable Realizations ror Logic Functions
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