LBIC imaging of semiconductor arrays: the cross-sectional model

DOI10.1016/j.mcm.2003.10.045zbMath1059.82538OpenAlexW1965326163MaRDI QIDQ1764959

Weifu Fang, Kazufumi Ito, David A. Redfern

Publication date: 22 February 2005

Published in: Mathematical and Computer Modelling (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1016/j.mcm.2003.10.045

zbMATH Keywords

HomogenizationInverse problemParameter identificationLBICSemiconductor arrays

Mathematics Subject Classification ID

PDEs in connection with optics and electromagnetic theory (35Q60) Inverse problems for PDEs (35R30) Statistical mechanics of semiconductors (82D37) Homogenization in context of PDEs; PDEs in media with periodic structure (35B27)

Related Items (1)

A homogenization model for laser beam-induced current imaging and detection of non-uniform\-ities in semiconductor arrays

Cites Work

• Parameter Identification for Semiconductor Diodes by LBIC Imaging
• Modeling and Analysis of Laser-Beam-Induced Current Images in Semiconductors
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