Self-dual self-testing multicycle circuits: Their properties

DOI10.1023/A:1010245914985zbMath1074.94525OpenAlexW2218199925MaRDI QIDQ1778424

Vl. V. Sapozhnikov, V. V. Sapozhnikov, M. Gessel', A. V. Dmitriev

Publication date: 17 June 2005

Published in: Automation and Remote Control (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1023/a:1010245914985

zbMATH Keywords

self-dual functionsMCNC benchmark circuitsmemory circuits

Mathematics Subject Classification ID

Analytic circuit theory (94C05)

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