Phase-type distributions for studying variability in resistive memories

DOI10.1016/J.CAM.2018.06.010zbMath1402.62348OpenAlexW2809243821WikidataQ129682673 ScholiaQ129682673MaRDI QIDQ1789681

J. B. Roldán, C. Acal, F. Jiménez-Molinos, Ana M. Aguilera, Juan Eloy Ruiz-Castro

Publication date: 10 October 2018

Published in: Journal of Computational and Applied Mathematics (Search for Journal in Brave)

Full work available at URL: http://hdl.handle.net/10481/69354

zbMATH Keywords

Weibull distributionstatistical modelingphase-type distributionsconductive filamentsreset processresistive switching memory

Mathematics Subject Classification ID

Applications of statistics in engineering and industry; control charts (62P30) Performance evaluation, queueing, and scheduling in the context of computer systems (68M20) Reliability and life testing (62N05)

Related Items (3)

Homogeneity problem for basis expansion of functional data with applications to resistive memories ⋮ Linear-phase-type probability modelling of functional PCA with applications to resistive memories ⋮ Graph-based algorithms for phase-type distributions

Uses Software

• EMpht

Cites Work

• Complex multi-state systems modelled through marked Markovian arrival processes
• Optimal order-replacement policy for a phase-type geometric process model with extreme shocks
• Reliability of a multi-state system subject to shocks using phase-type distributions
• Electro-thermo-chemical computational models for 3D heterogeneous semiconductor device simulation
• A catastrophic queueing model with delayed action
• Fundamentals of Matrix-Analytic Methods
• Input Modeling with Phase-Type Distributions and Markov Models
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