An overview on recent advances in statistical burn-in modeling for semiconductor devices

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Publication:1793947

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DOI10.1007/978-3-319-76035-3_26zbMath1397.62595OpenAlexW2804571297MaRDI QIDQ1793947

Daniel Kurz, Jürgen Pilz, Horst Lewitschnig

Publication date: 12 October 2018

Full work available at URL: https://doi.org/10.1007/978-3-319-76035-3_26

zbMATH Keywords

sampling burn-in binomial distribution area scaling power semiconductors

Mathematics Subject Classification ID

Applications of statistics in engineering and industry; control charts (62P30) Reliability and life testing (62N05)

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