Asymptotically optimal in reliability circuits in two bases under failures of \(0\) \((k-1)\) type at the outputs of elements

DOI10.3103/S1066369X18050018zbMath1430.94116OpenAlexW2801142483MaRDI QIDQ1795348

O. Yu. Barsukova, M. A. Alekhina

Publication date: 16 October 2018

Published in: Russian Mathematics (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.3103/s1066369x18050018

zbMATH Keywords

reliability and unreliability of circuitsynthesis of circuits composed of unreliable gatesunreliable functional gates\(k\)-valued logics functionfault of type \(k-1\)fault of type 0

Mathematics Subject Classification ID

Fault detection; testing in circuits and networks (94C12) Analytic circuit theory (94C05) Reliability, testing and fault tolerance of networks and computer systems (68M15)

Related Items

Synthesis of reliable circuits in the basis consisting of the Webb function in \(P_k\)

Cites Work

• Reliability of nonbranching programs in an arbitrary complete finite basis
• Sufficient conditions for realizability of Boolean functions by asymptotically optimal circuits with the unreliability \(2\varepsilon \)
• Upper bound of unreliability of circuits in a basis consisting of Webb functions
• Asymptotically optimal reliable circuits in Rosser-Turkett basis (in \(P_k\))
• On reliability of circuits over an arbitrary complete finite basis under single-type constant faults at outputs of elements
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