Complete diagnostic length 2 tests for logic networks under inverse faults of logic gates

DOI10.1134/S0081543818040168zbMath1437.94113OpenAlexW2887210250WikidataQ129369169 ScholiaQ129369169MaRDI QIDQ1798079

Kirill A. Popkov

Publication date: 23 October 2018

Published in: Proceedings of the Steklov Institute of Mathematics (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1134/s0081543818040168

zbMATH Keywords

circuitsBoolean function

Mathematics Subject Classification ID

Fault detection; testing in circuits and networks (94C12) Reliability, testing and fault tolerance of networks and computer systems (68M15) Switching theory, applications of Boolean algebras to circuits and networks (94C11)

Related Items (3)

Single diagnostic tests for inversion faults of gates in circuits over arbitrary bases ⋮ Short complete diagnostic tests for circuits implementing linear Boolean functions ⋮ On self-correcting logic circuits of unreliable gates with at most two inputs

Cites Work

• Synthesis of circuits admitting complete checking tests of constant length under inverse faults at outputs of elements
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