Parametric modeling for survival with competing risks and masked failure causes

DOI10.1023/A:1014891707936zbMath1037.62103OpenAlexW2165024200WikidataQ52039365 ScholiaQ52039365MaRDI QIDQ1812101

Benjamin Reiser, Emmanuel Yashchin, Betty J. Flehinger

Publication date: 18 June 2003

Published in: Lifetime Data Analysis (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1023/a:1014891707936

zbMATH Keywords

reliabilitymaskingWeibull distributionlife testing2-stage experimentation

Mathematics Subject Classification ID

Testing in survival analysis and censored data (62N03) Reliability and life testing (62N05)

Related Items (13)

Robust estimation with variational Bayes in presence of competing risks ⋮ The analysis of multivariate recurrent events with partially missing event types ⋮ On Competing Risks with Masked Failures ⋮ An alternative competing risk model to the Weibull distribution for modelling aging in lifetime data analysis ⋮ Semiparametric inference of competing risks data with additive hazards and missing cause of failure under MCAR or MAR assumptions ⋮ Regression analysis of competing risks data with general missing pattern in failure types ⋮ The competing risks Cox model with auxiliary case covariates under weaker missing-at-random cause of failure ⋮ Inference for the dependent competing risks model with masked causes of failure ⋮ Identifiability of masking probabilities in competing risks models with emphasis on Weibull models ⋮ Bayes estimators for reliability measures in geometric distribution model using masked system life test data ⋮ Inference About the Masking Probabilities in the Competing Risks Model ⋮ Maximum likelihood analysis of masked series system lifetime data ⋮ Bayesian Analysis of Masked Series System Lifetime Data

This page was built for publication: Parametric modeling for survival with competing risks and masked failure causes