Design of functional tests for single-chip microprocessors

zbMath0800.94292MaRDI QIDQ1813453

E. L. Kon, O. V. Goncharovskij

Publication date: 25 June 1992

Published in: Automation and Remote Control (Search for Journal in Brave)

Mathematics Subject Classification ID

Fault detection; testing in circuits and networks (94C12)

This page was built for publication: Design of functional tests for single-chip microprocessors