Minimal length test vectors for multiple-fault detection

DOI10.1016/j.tcs.2003.11.018zbMath1045.94548OpenAlexW1986803964MaRDI QIDQ1826631

Robert Kurshan, Zoltan Fueredi

Publication date: 6 August 2004

Published in: Theoretical Computer Science (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1016/j.tcs.2003.11.018

zbMATH Keywords

TestingFault detectionChinese Postman

Mathematics Subject Classification ID

Edge subsets with special properties (factorization, matching, partitioning, covering and packing, etc.) (05C70) Fault detection; testing in circuits and networks (94C12) Graph algorithms (graph-theoretic aspects) (05C85) Applications of graph theory to circuits and networks (94C15)

Cites Work

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• Partitioning circuits for improved testability
• The complexity of verification
• Syndrome-Testable Design of Combinational Circuits
• An Efficient Implementation of Edmonds' Algorithm for Maximum Matching on Graphs
• On the complexity of edge traversing
• Matching, Euler tours and the Chinese postman
• Bridging and Stuck-At Faults

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