A phase field model for failure in interconnect lines due to coupled diffusion mechanisms.

DOI10.1016/S0022-5096(02)00019-4zbMath1151.74305MaRDI QIDQ1852810

Deepali N. Bhate, Ashish Kumar, Allan F. Bower

Publication date: 8 January 2003

Published in: Journal of the Mechanics and Physics of Solids (Search for Journal in Brave)

Mathematics Subject Classification ID

Theories of fracture and damage (74A45) Technical applications of optics and electromagnetic theory (78A55)

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