A phase field model for failure in interconnect lines due to coupled diffusion mechanisms.
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Publication:1852810
DOI10.1016/S0022-5096(02)00019-4zbMath1151.74305MaRDI QIDQ1852810
Deepali N. Bhate, Ashish Kumar, Allan F. Bower
Publication date: 8 January 2003
Published in: Journal of the Mechanics and Physics of Solids (Search for Journal in Brave)
Theories of fracture and damage (74A45) Technical applications of optics and electromagnetic theory (78A55)
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