Diffraction and Palm measure of point processes

DOI10.1016/S1631-073X(02)00029-8zbMath1052.60037arXivmath/0208064OpenAlexW81519130MaRDI QIDQ1871538

Jean-Baptiste Gouéré

Publication date: 2003

Published in: Comptes Rendus. Mathématique. Académie des Sciences, Paris (Search for Journal in Brave)

Full work available at URL: https://arxiv.org/abs/math/0208064

zbMATH Keywords

crystalsPalm measurecut-and-project methoddiffraction measureautocorrelation measurestationary ergodic point process

Mathematics Subject Classification ID

Geometric probability and stochastic geometry (60D05) Stationary stochastic processes (60G10) Statistical mechanics of crystals (82D25) Point processes (e.g., Poisson, Cox, Hawkes processes) (60G55)

Related Items

Pure point diffraction and cut and project schemes for measures: the smooth case, On the (dis)continuity of the Fourier transform of measures, Fourier transformable measures with weak Meyer set support and their lift to the cut-and-project scheme, Algorithm for determining pure pointedness of self-affine tilings, Stationary processes and pure point diffraction, The computation of overlap coincidence in Taylor-Socolar substitution tiling, Spectral notions of aperiodic order, Substitution Delone sets with pure point spectrum are inter-model sets, Pure point diffractive substitution Delone sets have the Meyer property, Pure point spectrum for measure dynamical systems on locally compact Abelian groups, Pure point/continuous decomposition of translation-bounded measures and diffraction, Quasicrystals and almost periodicity

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