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On the influence of noise in the evaluation of the electrical oscillations occurring in the \(\alpha\)-Si/Si(p)/Si(n) device

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Publication:1878235
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DOI10.1016/j.chaos.2003.12.011zbMath1052.82562OpenAlexW1965633039MaRDI QIDQ1878235

K. G. Kyritsi, A. N. Anagnostopoulos

Publication date: 19 August 2004

Published in: Chaos, Solitons and Fractals (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1016/j.chaos.2003.12.011



Mathematics Subject Classification ID

Statistical mechanics of superconductors (82D55) Dynamical systems in other branches of physics (quantum mechanics, general relativity, laser physics) (37N20)


Related Items

Nonlinear electronic circuit. I: Multiple routes to chaos.



Cites Work

  • Measuring the strangeness of strange attractors
  • Recovering the attractor: A review of chaotic time-series analysis
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