Conditions for the coincidence of the TFR, TRV and CE models
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Publication:1884793
DOI10.1007/BF02777579zbMath1048.62097OpenAlexW2066424277MaRDI QIDQ1884793
Publication date: 5 November 2004
Published in: Statistical Papers (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1007/bf02777579
Related Items (12)
RELIABILITY COMPARISON OF TWO UNIT REDUNDANCY SYSTEMS UNDER THE LOAD REQUIREMENT ⋮ Tampered random variable modeling for multiple step-stress life test ⋮ Confidence regions in step-stress experiments with multiple samples under repeated type-II censoring ⋮ The step-stress tampered failure rate model under interval monitoring ⋮ A GLM approach to step-stress accelerated life testing with interval censoring ⋮ Optimum Design for Type-I Step-stress Accelerated Life Tests of Two-parameter Weibull Distributions ⋮ Models Comparison for Step-Stress Accelerated Life Testing ⋮ Testing for the validity of the assumptions in the exponential step-stress accelerated life-testing model ⋮ Interval estimation for exponential progressive type-II censored step-stress accelerated life-testing ⋮ On exact inferential results for a simple step-stress model under a time constraint ⋮ Inference in step-stress models based on failure rates ⋮ Bayesian analysis for step-stress accelerated life testing using Weibull proportional hazard model
Cites Work
- Equivalence of the tampered random variable and the tampered failure rate models in accelerated lifetesting for a class of life distributions having the ‘setting the clock back to zero property'
- A tampered failure rate model for step-stress accelerated life test
- Bayesian estimation and optimal designs in partially accelerated life testing
- Accelerated Life Testing - Step-Stress Models and Data Analyses
- Accelerated Testing
- Coincidence of two failure rate models
- Multiple step-stress accelerated life test: the tampered failure rate model
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