Run length distributions and economic design of \(\overline{X}\) charts with unknown process variance

DOI10.1007/BF02613907zbMath0897.62113MaRDI QIDQ1922594

Enrique Del Castillo

Publication date: 19 October 1998

Published in: Metrika (Search for Journal in Brave)

Full work available at URL: https://eudml.org/doc/176650

zbMATH Keywords

mean square errorrun length distributioncontrol limits

Mathematics Subject Classification ID

Applications of statistics in engineering and industry; control charts (62P30)

Related Items

Properties and performance of thec-chart for attributes data, Symmetric -charts: Sensitivity to nonnormality and control-limit estimation, A test for suitability of the preliminary samples for constructing control limits ofX¯chart, Parameter estimation and design considerations in prospective applications of theX¯ chart, Run length, average run length and false alarm rate of shewhart x-bar chart: exact derivations by conditioning

Cites Work

• Economically optimal c- and np-control charts
• A unified approach to optimal process control
• The Economic Design of Control Charts: A Unified Approach
• Shewhart x-charts with estimated process variance
• Short run spc based upon the second order dynamic linear model for trend detection