Continuum modeling of charged vacancy migration in elastic dielectric solids, with application to perovskite thin films

DOI10.1016/j.mechrescom.2007.08.002zbMath1258.74072OpenAlexW2071873242MaRDI QIDQ1939763

W. D. Nothwang, Michael A. Grinfeld, John D. Clayton, Peter W. Chung

Publication date: 5 March 2013

Published in: Mechanics Research Communications (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1016/j.mechrescom.2007.08.002

zbMATH Keywords

diffusionthin filmselectromechanicsvacanciesdielectric

Mathematics Subject Classification ID

Electromagnetic effects in solid mechanics (74F15) Thin films (74K35)

Related Items (2)

Numerical modelling of piezoelectric actuators exposed to hydrogen ⋮ Kinematics, electromechanics, and kinetics of dielectric and piezoelectric crystals with lattice defects

Cites Work

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