A reliability analysis of double-ring topologies with dual attachment using p-cycles for optical metro networks
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Publication:1957299
DOI10.1016/j.comnet.2009.10.018zbMath1205.68066DBLPjournals/cn/RioHAVDWCWPDD10OpenAlexW2070273958WikidataQ59340126 ScholiaQ59340126MaRDI QIDQ1957299
Publication date: 24 September 2010
Published in: Computer Networks (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1016/j.comnet.2009.10.018
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