Elastic fields due to an edge dislocation in an isotropic film-substrate by the image method

DOI10.1007/S00707-009-0226-8zbMath1397.74143OpenAlexW2071265974MaRDI QIDQ1958581

Yanyan Li

Publication date: 4 October 2010

Published in: Acta Mechanica (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1007/s00707-009-0226-8

Mathematics Subject Classification ID

Analytic approximation of solutions (perturbation methods, asymptotic methods, series, etc.) of equilibrium problems in solid mechanics (74G10) Thin films (74K35)

Related Items (13)

Effect of nanoscale amorphization in nanocrystalline bimaterials on dislocation emission from the tip of colinear linear cracks ⋮ Effect of special rotational deformation on dislocation emission from interface collinear crack tip in nanocrystalline bi-materials ⋮ Dislocation stability in three-phase nanocomposites with imperfect interface ⋮ An edge dislocation interacting with an elastic thin-layered semi-infinite matrix ⋮ Force on a screw dislocation in a multiphase laminated structure ⋮ Elastic behavior of an edge dislocation inside the nanoscale coating layer ⋮ Effect of cooperative grain boundary sliding and migration on dislocation emitting from a semi-elliptical blunt crack tip in nanocrystalline solids ⋮ Effects of surface/interface elasticity on the screw dislocation-induced stress field in an elastic film-substrate system ⋮ The interaction between a screw dislocation and a nano-inhomogeneity with a semi-infinite wedge crack penetrating the interface ⋮ A screw dislocation in a three-phase composite strip ⋮ On elastic interaction of a screw dislocation with a coated cylindrical inclusion ⋮ Effect of cooperative grain boundary sliding and migration on dislocation emission from interface collinear crack tip in nanocrystalline bi-materials ⋮ Fracture behavior investigation on an arbitrarily oriented sub-interface Zener-stroh crack

Cites Work

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• Exact solutions for a wedge disclination dipole in a transversely isotropic bimaterial
• Image decomposition method for the analysis of a mixed dislocation in a general multilayer
• Interface crack problems in layered orthotropic materials
• Elastic study on singularities interacting with interfaces using alternating technique. II: Isotropic trimaterial.
• Edge dislocation in a surface layer
• Line defects in the (110)‐plane of a cubic crystal—an outstanding problem solved by the integral formalism
• Thin Film Materials
• Exact Solutions for Periodic Interfacial Wedge Disclination Dipoles in a Hexagonal Bicrystal

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