Numerical simulations of island formation in a coherent strained epitaxial thin film system
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Publication:1975874
DOI10.1016/S0022-5096(99)00026-5zbMath0977.74548WikidataQ60160293 ScholiaQ60160293MaRDI QIDQ1975874
Publication date: 16 January 2002
Published in: Journal of the Mechanics and Physics of Solids (Search for Journal in Brave)
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Cites Work
- Evolution of waviness on the surface of a strained elastic solid due to stress-driven diffusion
- Stress singularities along a cycloid rough surface
- Some general properties of stress-driven surface evolution in a heteroepitaxial thin film structure
- Surface morphology evolution in stressed solids: Surface diffusion controlled crack initiation
- On the stability of a biaxially stressed elastic material with a free surface under variations in surface shape
- Three-dimensional finite element analysis of the evolution of voids and thin films by strain and electromigration induced surface diffusion
- Evolution of roughness on the surface of a strained elastic material due to stress-driven surface diffusion
