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The mechanics of electronic materials

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Publication:1976981
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DOI10.1016/S0020-7683(99)00087-6zbMath1075.74064MaRDI QIDQ1976981

Lambert B. Freund

Publication date: 2000

Published in: International Journal of Solids and Structures (Search for Journal in Brave)


zbMATH Keywords

dislocationsemiconductorstrain relaxationstress-driven surface morphology


Mathematics Subject Classification ID

Micromechanics of solids (74M25) Statistical mechanics of semiconductors (82D37)


Related Items (8)

Eshelby problem of polygonal inclusions in anisotropic piezoelectric full- and half-planes ⋮ Analysis of dislocation nucleation from a crystal surface based on the Peierls--Nabarro dislocation model. ⋮ Kinetics of crack initiation and growth in organic-containing integrated structures ⋮ The role of Eshelby stress in composition-generated and stress-assisted diffusion ⋮ Influence of strain on functional characteristics of nanoelectronic devices ⋮ Two imperfectly bonded half-planes with an arbitrary inclusion subject to linear eigenstrains in anti-plane shear ⋮ New phenomena concerning a screw dislocation interacting with two imperfect interfaces ⋮ Composition modulation and nanophase separation in a binary epilayer




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