A blackbox yield estimation workflow with Gaussian process regression applied to the design of electromagnetic devices
DOI10.1186/s13362-020-00093-1zbMath1469.62407arXiv2003.13278OpenAlexW3092130277MaRDI QIDQ1980858
Mona Fuhrländer, Sebastian Schöps
Publication date: 8 September 2021
Published in: Journal of Mathematics in Industry (Search for Journal in Brave)
Full work available at URL: https://arxiv.org/abs/2003.13278
blackboxMonte Carlofailure probabilityuncertainty quantificationGaussian process regressionsurrogate modelyield analysis
Nonparametric regression and quantile regression (62G08) Gaussian processes (60G15) Bayesian inference (62F15) Applications of statistics in engineering and industry; control charts (62P30)
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