Stochastic modeling of random access memories reset transitions
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Publication:1997519
DOI10.1016/j.matcom.2018.11.016OpenAlexW2903204717WikidataQ128836595 ScholiaQ128836595MaRDI QIDQ1997519
M. Carmen Aguilera-Morillo, F. Jiménez-Molinos, J. B. Roldán, Ana M. Aguilera
Publication date: 2 March 2021
Published in: Mathematics and Computers in Simulation (Search for Journal in Brave)
Full work available at URL: http://hdl.handle.net/10481/71546
penalized splinesfunctional dataKarhunen-Loève expansionresistive switchingdevice variabilityresistive memories
Related Items (2)
Homogeneity problem for basis expansion of functional data with applications to resistive memories ⋮ Linear-phase-type probability modelling of functional PCA with applications to resistive memories
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