Anisotropic phase field solution for morphological evolution and migration of inclusions in piezoelectric films

DOI10.1016/J.APM.2014.12.005zbMath1443.74181OpenAlexW2092711466MaRDI QIDQ2009940

Yanyan Li

Publication date: 3 December 2019

Published in: Applied Mathematical Modelling (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1016/j.apm.2014.12.005

zbMATH Keywords

phase field modelanisotropic diffusioninclusionpiezoelectric film

Mathematics Subject Classification ID

Electromagnetic effects in solid mechanics (74F15)

Related Items (1)

Two‐dimensional Green's function solution for a tangential line force buried in the three‐phase orthotropic piezoelectric structure

Cites Work

• Unnamed Item
• Elastic and piezoelectric fields due to polyhedral inclusions
• A finite element analysis of the motion and evolution of voids due to strain and electromigration induced surface diffusion
• Three-phase piezoelectric inclusions of arbitrary shape with internal uniform electroelastic field
• A phase field model for failure in interconnect lines due to coupled diffusion mechanisms.
• A conducting arc crack between a circular piezoelectric inclusion and an unbounded matrix
• Generalized Ginzburg-Landau and Cahn-Hilliard equations based on a microforce balance
• Thermoelastic vibration and buckling analysis of functionally graded piezoelectric cylindrical shells
• Vibration of beams with piezoelectric inclusions
• The Cahn–Hilliard gradient theory for phase separation with non-smooth free energy Part I: Mathematical analysis

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