A second-order operator splitting Fourier spectral method for models of epitaxial thin film growth

DOI10.1007/s10915-016-0340-4zbMath1372.35240OpenAlexW2566357679MaRDI QIDQ2014330

Jaemin Shin, June-Yub Lee, Hyun Geun Lee

Publication date: 11 August 2017

Published in: Journal of Scientific Computing (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1007/s10915-016-0340-4

zbMATH Keywords

high-order accuracyoperator splitting methodepitaxial thin film growthFourier spectral method

Mathematics Subject Classification ID

PDEs in connection with fluid mechanics (35Q35) Thin fluid films (76A20) Stability and convergence of numerical methods for initial value and initial-boundary value problems involving PDEs (65M12) Spectral, collocation and related methods for initial value and initial-boundary value problems involving PDEs (65M70)

Related Items (6)

Optimal rate convergence analysis of a second order scheme for a thin film model with slope selection ⋮ Energetics and coarsening analysis of a simplified non-linear surface growth model ⋮ Errors of an Implicit Variable-Step BDF2 Method for a Molecular Beam Epitaxial Model with Slope Selection ⋮ Regularized linear schemes for the molecular beam epitaxy model with slope selection ⋮ A Novel Second-Order Scheme for the Molecular Beam Epitaxy Model with Slope Selection ⋮ A linear, high-order, and unconditionally energy stable scheme for the epitaxial thin film growth model without slope selection

Cites Work

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• Stability Analysis of Large Time‐Stepping Methods for Epitaxial Growth Models

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