Design of optimal Bayesian reliability test plans for a parallel system based on type-II censoring
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Publication:2050836
DOI10.1007/978-981-15-8061-1_39zbMATH Open1499.62361OpenAlexW3113157562MaRDI QIDQ2050836
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Publication date: 31 August 2021
Full work available at URL: https://doi.org/10.1007/978-981-15-8061-1_39
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