The transition from generation-recombination noise in bulk semiconductors to discrete switching in small-area semiconductors
From MaRDI portal
Publication:2066253
DOI10.1016/j.physa.2021.125748OpenAlexW3170135757MaRDI QIDQ2066253
Publication date: 13 January 2022
Published in: Physica A (Search for Journal in Brave)
Full work available at URL: https://arxiv.org/abs/2106.01889
statistical physicsMOSFETsgeneration-recombination noisenoise processes and phenomena in electronic transportsmall-area semiconductors
Related Items (1)
Cites Work
- An alternative form of Hooge's relation for 1/f noise in semiconductor materials
- Estimation of the lowest limit of \(1/f\) noise in semiconductor materials
- The Statistical Energy-Frequency Spectrum of Random Disturbances
- Noise in Semiconductors: Spectrum of a Two-Parameter Random Signal
- Mathematical Analysis of Random Noise
- Unnamed Item
- Unnamed Item
- Unnamed Item
- Unnamed Item
- Unnamed Item
This page was built for publication: The transition from generation-recombination noise in bulk semiconductors to discrete switching in small-area semiconductors